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By Weronika Walkosz

This thesis provides effects from a mixed atomic-resolution Z-contrast and annular bright-field imaging and electron power loss spectroscopy within the Scanning Transmission Electron Microscopy, in addition to first ideas stories of the interfaces among crystalline β−Si3N4 and amorphous (i) CeO2-x in addition to (ii) SiO2 intergranular movie (IGF). those interfaces are of a good primary and technological curiosity simply because they play an enormous position within the microstructural evolution and mechanical houses of Si3N4 ceramics utilized in many hot temperature and strain functions. the most contribution of this paintings is its distinctive description of the bonding features of light atoms, specifically oxygen and nitrogen, at those interfaces, which has no longer been completed earlier than. The atomic-scale details at the association of either gentle and heavy atoms is necessary for life like modeling of interface houses, similar to interface power and ion shipping, and should facilitate elevated keep an eye on over the functionality of ceramic and semiconductor fabrics for a wide-range of applications.

This Doctoral Thesis has been accredited via the college of Illinois-Chicago, Chicago, USA.

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The low-loss region (typically\50 eV), corresponding to the interaction of an incident electron with the outer-shell atomic electrons, on the other hand, can be used to reveal specifics such as the thickness of the specimen, band gap, valence-electron density, and surface and interface states through analysis of the plasmon losses. Lastly, the high-loss region of the EELS spectrum (typically 50–1,000 eV) can be used to analyze the atom type through analysis of characteristic ionization edge energies representing transitions of the core electrons into unoccupied levels; elemental concentration and distribution from the integrated intensity of the edge; the chemical state, local structure, coordination, and bonding through analysis of the shape of the near-edge structure; and bond distances through the analysis of the extended energy-loss fine structures [43].

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